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Statistical analysis of reliability and life-testing models :theory and methods /
正題名/作者 ： Statistical analysis of reliability and life-testing models :/ Lee J. Bain, Max Engelhardt.
其他題名 ： theory and methods /
作者 ： Bain, Lee J.,
其他作者 ： Engelhardt, Max.
出版者 ： New York :M. Dekker,1991.
面頁冊數 ： vii, 496 p. ; 24 cm.
標題 ： Reliability (Engineering) - Statistical methods. -
ISBN ： 0824785061
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008 910124s1991 nyu b 00110 eng
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050 00$aTS173$b.B34 1991
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100 10$aBain, Lee J.,$d1939-$3164300
245 10$aStatistical analysis of reliability and life-testing models :$btheory and methods /$cLee J. Bain, Max Engelhardt.
250 $a2nd ed.
260 0 $aNew York :$bM. Dekker,$c1991.
300 $avii, 496 p. ; 24 cm.
490 1 $aStatistics, textbooks and monographs ;$vvol. 115
650 0$aReliability (Engineering)$xStatistical methods.$3160276
650 0$aAccelerated life testing.$3184175
650 0$aDistribution (Probability theory)$3142429
700 10$aEngelhardt, Max.$3164301
830 0$aStatistics, textbooks and monographs;$vv. 115.$3184174
Bain, Lee J.,1939-
Statistical analysis of reliability and life-testing models :theory and methods /Lee J. Bain, Max Engelhardt. - 2nd ed. - New York :M. Dekker,1991. - vii, 496 p. ; 24 cm. - Statistics, textbooks and monographs ;vol. 115. - Statistics, textbooks and monographs;v. 115..
ISBN: 0824785061
LCCN: 91007832Subjects--Topical Terms:
160276
Reliability (Engineering)
--Statistical methods.
LC Class. No.: TS173 / .B34 1991
Dewey Class. No.: 620/.00452
Statistical analysis of reliability and life-testing models :theory and methods /Lee J. Bain, Max Engelhardt. - 2nd ed. - New York :M. Dekker,1991. - vii, 496 p. ; 24 cm. - Statistics, textbooks and monographs ;vol. 115. - Statistics, textbooks and monographs;v. 115..
ISBN: 0824785061
LCCN: 91007832Subjects--Topical Terms:
160276
Reliability (Engineering)
--Statistical methods.
LC Class. No.: TS173 / .B34 1991
Dewey Class. No.: 620/.00452
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